Thermo Scientific Quattro S Environmental Scanning Electron Microscope (ESEM)

Thermo Scientific Quattro S is a state-of-the-art Field Emission Environmental Scanning Electron Microscope (FE-ESEM) designed for high-resolution imaging and advanced microstructural and compositional analysis. Its versatile operating modes allow the examination of a wide range of materials - from metals and ceramics to polymers, biological specimens, powders, composites, and hydrated samples - often with little or no sample preparation.

Key Capabilities

Multi-Vacuum Operation

The Quattro S offers three imaging modes to accommodate virtually any sample type:

  • High Vacuum (HiVac): Delivers maximum image resolution and contrast for conductive and stable materials.
  • Low Vacuum (LoVac): Enables imaging of non-conductive or insulating samples without the need for conductive coatings such as carbon or gold.
  • Environmental SEM (ESEM): Operates at chamber pressures up to 4,000 Pa, allowing direct observation of wet, hydrated, oily, outgassing, or beam-sensitive specimens in their natural state.

High-Resolution Field Emission Imaging

The microscope is equipped with a high-brightness Schottky Field Emission Gun (FEG), providing:

  • Exceptional image sharpness and contrast
  • High spatial resolution at both high and low accelerating voltages
  • Excellent beam stability for reliable imaging and analysis

Scanning Transmission Electron Microscopy (STEM)

The Quattro S includes STEM (Scanning Transmission Electron Microscopy) capability for the examination of thin specimens. STEM imaging provides enhanced contrast and enables high-resolution investigation of nanoscale structures, interfaces, particles, and thin films.

Advanced Elemental and Crystallographic Analysis

The system integrates powerful analytical tools that enable simultaneous structural and chemical characterization:

  • ChemiSEM Technology for rapid, live, color-coded elemental mapping
  • Energy Dispersive X-ray Spectroscopy (EDS) for qualitative and quantitative elemental analysis
  • Electron Backscatter Diffraction (EBSD) for crystallographic orientation, grain structure, phase identification, and texture analysis

 

Imaging Performance

  • High-resolution field emission SEM imaging
  • Magnification range from 5x to 1.000.000x
  • High-performance imaging at low accelerating voltages
  • Suitable for nanoscale characterization of a wide variety of materials

Typical Applications

The Thermo Scientific Quattro S is suitable for:

  • Materials science and metallurgy
  • Nanomaterials characterization
  • Failure and fracture analysis
  • Surface morphology investigations
  • Particle and powder analysis
  • Semiconductor and electronic components
  • Polymers and composites
  • Geological and mineralogical samples
  • Biological and life science specimens
  • Corrosion, coatings, and thin films
  • In-situ observation of hydrated or environmentally sensitive materials

The combination of high-resolution imaging, environmental capabilities, STEM functionality, and integrated EDS/EBSD analysis makes the Thermo Scientific Quattro S a versatile platform for comprehensive microscopic characterization across research and industrial applications.