Surface analysis

Atomic force microscope (AFM) - Asylum Research, Oxford Instruments

Form Talysurf i-Series PRO

Raman spectrometer - Scientific XploRA Plus V1.2 - HORIBA

3D digital microscope Hirox HRX-01 & NPS with nano confocal profilometer

A testing rig for the evaluation of real contact area during static and dynamic contact conditions

Atomic force microscope (AFM) - Veeco

Scanning electron microscope (SEM) - JEOL JSM IT100

Spectrometer and microscope - Perkin-Elmer

3D optical microscope - Bruker - ContourGT-K0

Optical microscope - Nikon - LV150

Contact angle measuring system - KSV - CAM 101

Residual stress measurement unit - HBM - MTS 3000

Roughness measurement - Hommel Werke

Combined stereozoom microscope - Wild

Ferographic microscope - Olympus - CH-2

Precision Sectioning Saw - Buehler - Isomet 1000

SEM speciment preparation - Baltec - SCD 005

Automatic polishing mashine - Struers- RotoPol, RotoForce

Microhardness tester - Leitz - Miniload 2

Nanoindenter - Step 700 + UNHT³ - Anton Paar