Surface analysis

X-ray Photoelectron Spectroscopy

Thermo Scientific Quattro S Environmental Scanning Electron Microscope (ESEM)

Nanoindenter - Step 700 + UNHT³ - Anton Paar

Atomic force microscope (AFM) - Asylum Research, Oxford Instruments

Form Talysurf i-Series PRO

A testing rig for the evaluation of real contact area during static and dynamic contact conditions

3D optical microscope - Bruker - ContourGT-K0

3D digital microscope Hirox HRX-01 & NPS with nano confocal profilometer

Raman spectrometer - Scientific XploRA Plus V1.2 - HORIBA

Spectrometer and microscope - Perkin-Elmer

Gatan PECS II Model 685 ion beam polisher/coater

Contact angle measuring system - KSV - CAM 101

Roughness measurement - Hommel Werke

Microhardness tester - Leitz - Miniload 2

Residual stress measurement unit - HBM - MTS 3000

Atomic force microscope (AFM) - Veeco

Optical microscope - Nikon - LV150

SEM specimen preparation - Baltec - SCD 005

Automatic polishing machine - Struers- RotoPol, RotoForce

Combined stereozoom microscope - Wild

Precision Sectioning Saw - Buehler - Isomet 1000