Surface analysis

Atomic force microscope (AFM) - Asylum Research, Oxford Instruments

3D optical microscope - Bruker - ContourGT-K0

Contact angle measuring system - KSV - CAM 101

Residual stress measurement unit - HBM - MTS 3000

Roughness measurement - Hommel Werke

Spectrometer and microscope - Perkin-Elmer

Atomic force microscope (AFM) - Veeco

Scanning electron microscope (SEM) - JEOL JSM IT100

Optical microscope - Nikon - LV150

Combined stereozoom microscope - Wild

Microhardness tester - Leitz - Miniload 2

Ferographic microscope - Olympus - CH-2

Precision Sectioning Saw - Buehler - Isomet 1000

SEM speciment preparation - Baltec - SCD 005

Automatic polishing mashine - Struers- RotoPol, RotoForce

Climate chamber - Weiss - 300/40