Atomic force microscope (AFM) - Asylum Research, Oxford Instruments

Atomic force microscope MFP-3D Origin

  • Scanning range (area): 120 µm x 120 µm
  • Scanning range (height): 15 µm
  • Sample size: up to diameter of 80 mm and thickness of 30 mm
  • Possibility of controlled heating: from ambient to 275 °C
  • Scanning modes: contact mode/LFM, tapping mode with phase and Q-control, Force spectroscopy, Dual AC and Dual AC Resonance Tracking (DART), loss tangent imaging, force spectroscopy and force mapping, AM-FM viscoelastic mapping, liquid imaging, electric force microscopy, surface potential microscopy, magnetic force microscopy, piezoresponse force microscopy
  • Analysis: topography, roughness, thickness of thin films, qualitative and quantitative determination of mechanical properties and friction on nano scale